[Download] "Fujitsu and University of Toronto Develop High-Reliability Read-Method for Spin-Torque-Transfer MRAM, Next-Generation Non-Volatile Memory; Major Step Toward Practical Use in Devices by Replacing Flash Memory" by ENP Newswire ~ Book PDF Kindle ePub Free

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• Title: Fujitsu and University of Toronto Develop High-Reliability Read-Method for Spin-Torque-Transfer MRAM, Next-Generation Non-Volatile Memory; Major Step Toward Practical Use in Devices by Replacing Flash Memory
• Author : ENP Newswire
• Release Date : January 10, 2010
• Genre: Business & Personal Finance,Books,Economics,
• Pages : * pages
• Size : 82 KB

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ENPNewswire-10 February 2010-Fujitsu and University of Toronto Develop High-Reliability Read-Method for Spin-Torque-Transfer MRAM, Next-Generation Non-Volatile Memory; Major step toward practical use in devices by replacing flash memory(C)2010 ENPublishing - http://www.enpublishing.co.uk Release date- 10022010 - Kawasaki, Japan and Toronto, Canada - Fujitsu Laboratories Limited and the University of Toronto today announced that they have jointly developed the world's first high-reliability read-method for use with spin-torque-transfer (STT) MRAM(1) that is insusceptible to erroneous writes.

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